From 87a28340d625f550f2546cb93a7a214672dd9601 Mon Sep 17 00:00:00 2001 From: "W. Trevor King" Date: Thu, 18 Feb 2010 16:53:01 -0500 Subject: [PATCH] Fix figure 1.1 referencing/labeling --- tex/src/introduction/main.tex | 9 ++++----- 1 file changed, 4 insertions(+), 5 deletions(-) diff --git a/tex/src/introduction/main.tex b/tex/src/introduction/main.tex index 18f6104..06d59da 100644 --- a/tex/src/introduction/main.tex +++ b/tex/src/introduction/main.tex @@ -36,7 +36,7 @@ in DNA\citep{rief99} and polysaccharides\citep{rief97a}. An AFM uses a sharp tip integrated at the end of a cantilever to interact with the sample. Cantilever bending is measured by a laser reflected off the cantilever and incident on a position sensitive photodetector -(\cref{fig:afm-schematic}. When the bending force constant of the +(\cref{fig:afm-schematic}). When the bending force constant of the cantilever is known\citep{levy02}, the force applied to the sample can be calculated. The forces that can be applied and measured with an AFM range from tens of piconewtons to hundreds of nanonewtons. The @@ -52,12 +52,11 @@ theoretical research. \begin{figure} \begin{center} \includegraphics{figures/schematic/afm}% - \label{fig:afm-schematic}} - \caption{(a) Operating principle for Atomic Force Microscopy. A - sharp tip integrated at the end of a cantilever interacts with the + \caption{Operating principle for Atomic Force Microscopy. A sharp + tip integrated at the end of a cantilever interacts with the sample. Cantilever bending is measured by a laser reflected off the cantilever and incident on a position sensitive - photodetector.} + photodetector.\label{fig:afm-schematic}} \end{center} \end{figure} -- 2.26.2