From 7a76d98bd23abcfbb39be87e3f245b8941a86191 Mon Sep 17 00:00:00 2001 From: "W. Trevor King" Date: Wed, 15 May 2013 22:06:18 -0400 Subject: [PATCH] calibcant/procedure.tex: Describe residual and approach-retract Mom suggested more clarity. --- src/calibcant/procedure.tex | 9 ++++++--- 1 file changed, 6 insertions(+), 3 deletions(-) diff --git a/src/calibcant/procedure.tex b/src/calibcant/procedure.tex index 2493fb8..9f92222 100644 --- a/src/calibcant/procedure.tex +++ b/src/calibcant/procedure.tex @@ -36,9 +36,12 @@ during this approach--retract cycle is analyzed to measure $\sigma_p$ \begin{center} \includegraphics[width=0.8\textwidth]{figures/calibcant/bump.png} \caption{Measuring the photodiode sensitivity $\sigma_p$ by - bumping the cantilever tip on the substrate surface. This is - the first bump from the 2013-02-07T08-20-46 - calibration.\label{fig:calibcant:bump}} + bumping the cantilever tip on the substrate surface. The second + panel shows the residual (measured data minus modeled data) for + the bump. There are two deflection measurements at each + position, one from the approach phase, and one from the + retraction phase. This is the first bump from the + 2013-02-07T08-20-46 calibration.\label{fig:calibcant:bump}} \end{center} \end{figure} -- 2.26.2