From: W. Trevor King <wking@tremily.us>
Date: Sun, 5 May 2013 18:53:29 +0000 (-0400)
Subject: root.bib: Fix markup issues for BDrake, YMartin, and HKWickramasinghe
X-Git-Tag: v1.0~259
X-Git-Url: http://git.tremily.us/?a=commitdiff_plain;h=aa9110710f009775d5a7bc61ac5850130e7f6c25;p=thesis.git

root.bib: Fix markup issues for BDrake, YMartin, and HKWickramasinghe

Also remove a duplicate martin87 entry.
---

diff --git a/src/root.bib b/src/root.bib
index 99e01a9..7b2c884 100644
--- a/src/root.bib
+++ b/src/root.bib
@@ -249,7 +249,7 @@
 @string{MDors = "Dors, M."}
 @string{LDougan = "Dougan, Lorna"}
 @string{LDoup = "Doup, L."}
-@string{BDrake = "Drake, B."
+@string{BDrake = "Drake, B."}
 @string{TDrobek = "Drobek, T."}
 @string{Drexel = "Drexel University"}
 @string{OKDudko = "Dudko, Olga K."}
@@ -627,6 +627,7 @@
 @string{MMarra = "Marra, M."}
 @string{PMarszalek = "Marszalek, Piotr E."}
 @string{MMartin = "Martin, M. J."}
+@string{YMartin = "Martin, Y."}
 @string{HMassa = "Massa, H."}
 @string{JMathe = "Math\'e, J\'er\^ome"}
 @string{AMatouschek = "Matouschek, Andreas"}
@@ -1022,7 +1023,7 @@
 @string{JWetter = "Wetter, J."}
 @string{EPWhite = "White, Ethan P."}
 @string{AWhittaker = "Whittaker, A."}
-@string{YWickramasinghe = "Wickramasinghe, H. K."}
+@string{HKWickramasinghe = "Wickramasinghe, H. K."}
 @string{RWides = "Wides, R."}
 @string{AWiita = "Wiita, Arun P."}
 @string{MWilchek = "Wilchek, Meir"}
@@ -1978,8 +1979,8 @@
         rationalized at the molecular level."
 }
 
-@article{ martin87
-  author = YMartin #" and "# CCWilliams #" and "# HKWickamasinghe,
+@article{ martin87,
+  author = YMartin #" and "# CCWilliams #" and "# HKWickramasinghe,
   title = {Atomic force microscope---force mapping and profiling on a
     sub 100-\AA scale},
   year = 1987,
@@ -1989,8 +1990,11 @@
   volume = 61,
   number = 10,
   pages = {4723--4729},
+  issn = "0021-8979",
+  issn_online = "1089-7550",
   doi = {10.1063/1.338807},
-  url = {http://jap.aip.org/resource/1/japiau/v61/i10/p4723_s1}
+  url = {http://jap.aip.org/resource/1/japiau/v61/i10/p4723_s1},
+  language = "eng",
   abstract = {A modified version of the atomic force microscope is
     introduced that enables a precise measurement of the force between
     a tip and a sample over a tip-sample distance range of 30--150
@@ -9151,7 +9155,7 @@
 }
 
 @article{ williams86,
-  author = CCWilliams #" and "# HWickramasinghe,
+  author = CCWilliams #" and "# HKWickramasinghe,
   title = "Scanning thermal profiler",
   journal = APL,
   year = 1986,
@@ -9180,33 +9184,6 @@
   language = "eng",
 }
 
-@article{ martin87,
-  author = MMartin #" and "# CCWilliams #" and "# HWickramasinghe,
-  title = "Atomic force microscope-force mapping and profiling on a sub
-    100-\AA scale",
-  journal = JAP,
-  year = 1987,
-  month = may,
-  day = 15,
-  volume = 61,
-  number = 10,
-  pages = "4723--4729",
-  abstract = "A modified version of the atomic force microscope is
-    introduced that enables a precise measurement of the force between
-    a tip and a sample over a tip-sample distance range of 30--150
-    \AA. As an application, the force signal is used to maintain the
-    tip-sample spacing constant, so that profiling can be achieved
-    with a spatial resolution of 50 \AA. A second scheme allows the
-    simultaneous measurement of force and surface profile; this scheme
-    has been used to obtain material-dependent information from
-    surfaces of electronic materials.",
-  issn = "0021-8979",
-  issn_online = "1089-7550",
-  doi = "10.1063/1.338807",
-  URL = "http://jap.aip.org/resource/1/japiau/v61/i10/p4723_s1",
-  language = "eng",
-}
-
 @article{ meyer88,
   author = GMeyer #" and "# NMAmer,
   title = "Novel optical approach to atomic force microscopy",