From: W. Trevor King <wking@drexel.edu>
Date: Thu, 18 Feb 2010 21:53:01 +0000 (-0500)
Subject: Fix figure 1.1 referencing/labeling
X-Git-Tag: v1.0~455
X-Git-Url: http://git.tremily.us/?a=commitdiff_plain;h=87a28340d625f550f2546cb93a7a214672dd9601;p=thesis.git

Fix figure 1.1 referencing/labeling
---

diff --git a/tex/src/introduction/main.tex b/tex/src/introduction/main.tex
index 18f6104..06d59da 100644
--- a/tex/src/introduction/main.tex
+++ b/tex/src/introduction/main.tex
@@ -36,7 +36,7 @@ in DNA\citep{rief99} and polysaccharides\citep{rief97a}.  An AFM uses
 a sharp tip integrated at the end of a cantilever to interact with the
 sample.  Cantilever bending is measured by a laser reflected off the
 cantilever and incident on a position sensitive photodetector
-(\cref{fig:afm-schematic}.  When the bending force constant of the
+(\cref{fig:afm-schematic}).  When the bending force constant of the
 cantilever is known\citep{levy02}, the force applied to the sample can
 be calculated.  The forces that can be applied and measured with an
 AFM range from tens of piconewtons to hundreds of nanonewtons.  The
@@ -52,12 +52,11 @@ theoretical research.
 \begin{figure}
   \begin{center}
   \includegraphics{figures/schematic/afm}%
-    \label{fig:afm-schematic}}
-  \caption{(a) Operating principle for Atomic Force Microscopy.  A
-    sharp tip integrated at the end of a cantilever interacts with the
+  \caption{Operating principle for Atomic Force Microscopy.  A sharp
+    tip integrated at the end of a cantilever interacts with the
     sample.  Cantilever bending is measured by a laser reflected off
     the cantilever and incident on a position sensitive
-    photodetector.}
+    photodetector.\label{fig:afm-schematic}}
   \end{center}
 \end{figure}